Characterization of Proton Damage in Light-Emitting Diodes
- Topics:
- Electrical and Electronic
- Tags:
- Degradation,
- Diode,
- Engineering,
- Light-emitting Diode
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Overview: This white paper reveals that Proton damage is investigated for several types of modern light-emitting diodes, examining the damage from the standpoint of older models based on lifetime degradation as well as the simpler method of normalized degradation. It also outlines that an empirical model is developed to describe injection-enhanced annealing in amphoterically doped LEDs. Experimental results on aged devices show that wear out degradation does not decrease the sensitivity of devices to radiation damage.
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Format: PDF | Size: 240KB | Date: Feb 2001 | Pages: 8



